Gold standard for JEDEC® DDR4 memory device for your IP, SoC, and system-level design verification.

In production since 2011 on dozens of production designs.

This Cadence® Verification IP (VIP) supports the JEDEC® Low Power Memory Device, DDR4 SDRAM standard. It provides a mature, highly capable compliance verification solution that supports simulation, and formal analysis, making it applicable to intellectual property (IP), system-on-chip (SoC), and system-level verification. The DDR4 SDRAM VIP is compatible with the industry-standard Universal Verification Methodology (UVM), runs on all leading simulators, and leverages the industry-standard Cadence Memory Model core architecture, interface, and use model.

DDR4 diagram

Product Highlights

  • Hundreds of protocol and timing checkers to easily catch design bugs
  • Hundreds of predefined configurations based on specific memory vendors part numbers datasheets or generic JEDEC definitions available on ememory.com
  • Transaction and memory callbacks for all protocol, model states, and device memory events
  • Ability to optionally skip initializations or dynamically change configuration parameters
  • Packet tracker creation for easy debugging
  • Extensive functional coverage in SystemVerilog
  • Integrated with the DFI DDR5 solution for IP level verification
  • Plug-and-play connectivity to System Performance Analyzer for Sub-system or SoC performance verification
  • Support testbench language interfaces for SystemVerilog, UVM, OVM, and SystemC

Key Features

The following table describes key features from the specifications that are implemented in the VIP:

Feature Name

Description

Data Width, Density

  • 4, 8, and 16. 2 Gb to 16 Gb

Speed

  • 1600, 1866, 2133, 2400, 2666, and 3200

Bank Groups

  • Modeling the concept and the timing associated with the back-to-back accesses to the same and difference bank group

General DDR Functionality and Timing Checks

  • Precharge, Activate, Read, Write, Mode Register Write, Write leveling, ODT checks, Power Down, Self Refresh, Initialization, and all related timing checks

Reduced Pin Count

  • A16..A14 are multiplexed with ras, cas and webar pins and dedicated act pin for Activate command

Parity Error Injection

  • Supports Parity Error injection using callbacks

3DS Level

  • Supports command decoding

3DS Read and Write

  • Supports 3DS Read and Write commands for 2H, 4H, and 8H combinations

More Read Training Options

  • More MPR registers organized as pages. More options of reading those registers and preamble training

Reading of Mode Register Settings

  • Some important setting of the more registers are shadowed into page-2 MPRs

Data Mask and Data Bus Inversion

  • Data on the bus can be inverted during both read and write to save power. Both Data Mask and Data Bus inversion features can be set using mode registers

Per-DRAM Addressing

  • Allows mode registers of each DRAM on the DIMM to be programmed independently

CAL Mode

  • Allows CSBAR to be asserted a few cycles before actual command details

Write CRC

  • CRC is checked for writes and passes the error to the controller. CRC failures will let the write go through if Data Mask is disabled, and will block writes if that Mask is enabled

Parity

  • Parity checking is off by default, but when enabled parity is checked for each command before execution and also detailed recovery in case of errors and reporting of logs through MPR Reads

Control Gear Down Mode

  • Allows the DRAM to operate in 2N mode

Jitter, Drift, and Skews

  • Support of tDQSCK jitters, drift per operating voltage and temperature and skew

Configurable Preamble

  • Allows both 1CK and 2CK preambles to be selected for both read and write

Refresh Options

  • Normal mode refresh, self refresh, temperature controller self refresh, Low Power Array self refresh, and fine-granularity refresh

Maximum Power Saving Mode

  • Preserves the mode register settings, but loses data

RTT

  • Complete modelling of all RTT values, RTT_NOM, RTT_Park, and RTT_Wr with the internal register representing the value of RTT at a given point of time, based on the mode of operation

Connectivity Test Mode

  • Allows DRAM to enter CT Mode when Test Enable (TEN) pin is asserted HIGH

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