Minimize Layout Iterations and EM Errors with Simulation-Driven Routing

Electromigration (EM) has a major impact on IC reliability and lifespan, and it poses additional challenges as we move to lower process nodes.

In this webinar and demonstration, learn how to address EM concerns with simulation-driven routing (SDR).

Built upon the Cadence® electrically aware design (EAD) technology, SDR provides immediate EM and parasitic feedback for developing layout geometries to connect components.