CadenceLIVE Europe – OnDemand

Academic and Entrepreneur Showcase

Design of Low Phase Noise Amplifier with 50GHz Bandwidth

Vijayalakshmi Surendranath Shroff, University of Paderborn

gm/ID Based Circuit Design with the Expert Design Plan (EDP) Toolbox

Matthias Schweikardt, Reutlingen University

Integration of Piezoresistive Parameters into BSIM Models

Kim Allinger, Hamburg University of Technology
Matthias Kuhl, University of Freiburg - IMTEK

Process Design Kit Adaptation for Vertical Nanowire MOSFET in an IC Design Flow

Pavan Kubair, Lund University
Arturo Prieto, Lund University
Lars Ohlsson Fhager, Lund University
Marcus Sandberg, Lund University
Joachim Rodrigues, Lund University

Reinforcement Learning Environment for Circuit Sizing in a Transformed Action Space Based on Cadence Spectre

Yannick Uhlmann, Electronics & Drives (HSRT)
Jürgen Scheible, Electronics & Drives (HSRT)

Semi-Automatic Test Bench Generation and Parameter Extraction Tool Using Cadence SKILL

Alexander Meyer, RWTH Aachen University
Leon Wiehs, RWTH Aachen University
Ralf Wunderlich, RWTH Aachen University
Stefan Heinen, RWTH Aachen University

Specialization and Performance Optimization of a TTA Processor for Communication in Harsh Environments using Timing Speculation

Malte Hawich, University of Hannover

Introducing Bifrost Communications

Jesper Bevensee Jensen, Bifrost Communications

Introducing Wiyo Technologies

Patricia Fermin de Moreno, Wiyo Technologies

Introducing Synthara

Manu V Nair, Synthara
Alessandro Aimar, Synthara

Introducing Fleeptech

Giorgio Dell'Erba, Fleeptech

Introducing Lotus Microsystems

Ahmed Ammar, Lotus Microsystems

Introducing SkyCore Semiconductors

Pere Llimos Muntal, Skycore Semiconductors

Introducting DeepDetection

Colin Burnham, DeepDetection
Jose Gabriel Macias, DeepDetection

Automotive & IP

Development of Radar Algorithm for the Tensilica Processor

Andy Heinig, Fraunhofer IIS/EAS

FISH: Fault Injection Self-Detecting Chip for Analyzing Radiation Effects on Memory Elements

Gia Bao Thieu, TU Braunschweig
Moritz Weißbrich, TU Braunschweig

Functional Safety Analysis: Deal with Integrators Customizations

Francesco Lertora, Cadence
Sanjay Singh, Texas Instruments
Rajat Mehrotra, Texas Instruments

ISO26262 Functional Safety Mechanism Designed in GlobalFoundries' 22FDX Automotive Digital Design Flow

Falk Tischer, GlobalFoundries
Nidish Gaur, GlobalFoundaries

Pre-Silicon Functional Safety Verification Strategy - Mixed-Signal ICs

Silvia Strähle, Infineon Technologies
Rania Sanaa, Infineon Technologies AG
Joice George, Infineon Technologies AG

Ultra-Low-Power Implementation of Tensilica Fusion F1 Processor

Sven Brunmark, Xenergic
Babak Mohammadi, Xenergic

Verifying ECCs used in Safety Critical Designs with Formal

Aman Kumar, Infineon Technologies
Daniel Gerl, Infineon Technologies

Cloud

Accelerate Time to Results with Flexible Compute Choices on AWS

Eran Brown, AWS

Cadence Design Flow for Advance RF/Mixed-Signal ICs

Savvas Sgourenas, MEICSi

Scaling to 1 Million+ Cores to Reduce Time to Results, with up to 90% Discount on Compute Costs

Ludvig Nordstrom, AWS

Using Cadence in the AWS Cloud

Shawn Ruby, Ruby Cherry EDA

Computational Fluid Dynamics

AeroDelft CFD Projects

Francesco Granata, AeroDelft
Abel Versloot, AeroDelft

Investigating the Circumferential Inhomogeneous Flow of Centrifugal Compressor Using Cadence CFD

Loic Reymond, Institute of Jet Propulsion and Turbomachinery - RWTH Aachen University

Predicting Reentry Trajectories Into the Atmosphere of Mars

Maximilian Maigler, Universität der Bundeswehr München
Valentina Pessina, UniBw Munich

Custom/Analog Design

AgeMOS2 BTI Model for Aging Simulations in Advanced Nodes

Andre Lange, Fraunhofer IIS/EAS

Aging Models and Simulation for RF and Analog Applications

Ofer Tamir, Tower Semiconductor
Alex Kozhekin, Tower Semiconductor

Design Verification for X-FAB Combined Flash and EEPROM IPs – SpectreX vs. APS Benchmark

Marco Sommer, X-FAB
Alexander Gittel, X-FAB

Fault Simulation of X-FAB Memory IPs Using Legato Reliability

Christophe Sabatier, X-FAB
Andrey Karavaev, X-FAB

Improve MC Analysis Performance Using Spectre Native Fast MC Solution for Advanced Nodes

Dinesh Babu Rajendran, Intel
Puneet Singh, Intel

Layout Verification and Optimization by Pattern Matching
2022 Update: last updated 11/30/21

Jaap van der Sluijs, NXP

Multi-Stage Trimming Flow for High-Precision Analog Circuit Design

Florin Burcea, Bosch Sensortec GmbH
Lucian Stoica, Bosch Sensortec GmbH

PG Pcells- A Correct by Construction Power and Ground Distribution Strategy

Gaurav Masiwal, IC Mask Design
Cíarán Whyte, IC Mask Design Ltd.

Statistical Reliability Simulations with the Cadence Virtuoso ADE Product Suite

Leonard Heiss, Intel
Andreas Lachmann, Intel
Clement Melen, Intel
Reiner Schwab, Intel

Utilizing Virtuoso CLE (Concurrent Layout Editor) Tool to Reduce Critical Layout Design Time and Improve Productivity

Jiri Dak, Analog Devices
Eduard Raines, Analog Devices

Virtuoso Design Planner Analysis and Design Intent, A Way Ahead Than Traditional Implementation for Chips Design: The New Methodology for the Next MSoT Smart Power (BCD) Designs

Livio Fratantonio, STMicroelectronics
Massimiliano Innocenti, STMicroelectronics
Riccardo Guglielmo, STMicroelectronics
Stefano Basile, Cadence
Jonhatan Elias Olave, Cadence

Voltus-XFi – Efficient EMIR Methodologies for Signoff

Luis Abreu, Intel
Lisa Chu, Intel
Maharshi Solanki, Intel
Richa Agrawal, Intel
Ayan Roy Chowdhury, Intel

Voltus-XFI - Next Generation of EMIR Flow

Qiang Wang, NXP
Kai Schiller, Cadence

Digital Design & Signoff

A Novel Approach of Reducing Power Consumption of Design Using Joules RTL Low-Power Solution

Chandra Sekhar Naik Banavath, Infineon Technologies
Jibanjeet Mishra, Infineon Technologies

Cerebrus and Innovus Mixed Placer as Key Approaches for a Complex 7nm Design

Thomas Haase, Renesas

Cerebrus PPA Optimization on the Next Generation of High-End Microcontroller CPU Core

Olivier Uliana, STMicroelectronics

Design Enablement of 2D/3D Thermal-aware Analysis and 3-dies Stack

Mohamed Naeim, Cadence
Dragomir Milojevic, IMEC

Early Power Analysis Using Joules

Shane Gallagher, Analog Devices

Imec IClink – Preparing our Digital ASIC Design Implementation Teams for Future Advanced Node Projects

Geert Vanwijnsberghe, IMEC
Ilse Vos, IMEC

Lithography Hotspot Detection with Cadence LPA tool: from P&R to Signoff

Lise Doyen, STMicroelectronics

Timing Constraints Consistentency Checked with Conformal Litmus

Jörg Lindemann, Finisar/II-VI/Coherent

Using Physical Synthesis and Physical Tools in RISC-V IP Development Flow

Premysl Vaclavik, Codasip

Mixed-Signal Design

Advanced Layout Implementation of Digital Blocks in Analog Environment

Yan Woon Chong, Intel

Advancing Design and Verification of Mixed-Signal Systems through Cadence Virtuoso ADE - MATLAB/Simulink Integration Workflows

Ganesh Raj Rathinavel, Mathworks
Andrew Beckett, Cadence

Automatic Generation of Multiple GF-22FDX OpAmp Variants and Layouts in the Virtuoso Suite by Incorporating ID-Xplore of Intento Design with IIP of Fraunhofer

Benjamin Prautsch, Fraunhofer IIS/EAS
Uwe Eichler, Fraunhofer IIS/EAS
Ramy Iskander, Intento Design
Jose Bonan, Intento Design
Anoukis Boutros, Intento Design

Contributions to Accellera UVM-AMS Standardizations by Renesas and Cadence

Peter Grove, Renesas
Steven Holloway, Renesas
Shekar Chetput, Cadence
Tim Pylant, Cadence

From Spec to Virtuoso

Juan Verdu, Texas Instruments
Angelika Keppeler, TI
Jerry Chang, TI

Improving Performance of Analog/Mixed-Signal Layouts with Voltus-Fi

Guenter Haider, Infineon
Adrian Bertsovskyi, eesy-ic

Investigation of FastSpice Engine SpectreFX

Mudasir Bashir, Infineon Austria AG
Haiko Morgenstern, Infineon

Model Validation Using Virtuoso ADE Assembler/vManager

Peter Grove, Renesas

Virtuoso ART Automated Analog/Digital Routing in Samsung Advanced Nodes and Mature Nodes

Sungsik Park, Samsung Electronics
Seungil Chai, Samsung Electronics
K.B. Lee, Cadence
Sanjib Ghosh, Cadence

PCB & System Analysis

A 35GHz, Multi AFE & SerDes Interfaces Device Substrate Design for Satellite Communication Systems

Eran Rotem, Satixfy
Bojidar Avdjiiski, Satixfy

Design Challenges for Rugged PCBs

János Lazányi, PCB Design

Geometry Pre-Processing with ANSA for Clarity EM Analysis

Christos Liontas, BETA CAE Systems SA
Athanasios Papadopoulos, BETA CAE Systems SA

Optimize Faster High-Speed Vias Using AI-Enabled Optimality Explorer

Kristoffer Skytte, Cadence
Natalia Floman, Infineon

Optimizing an Bluetooth Antenna for Industrial IoT Applications

Dirk Mueller, FlowCAD

Productivity enhancement for Allego PCB and IC Packaging

Rolf Nick, FlowCAD

Structured Thermal Analysis on a Real Design Example

Tobias Best, ALPHA-Numerics

Thermally Aware High-Power Inverter Board for Battery-Powered Applications

Prospero Lombardi, STMicroelectronics

RF & Systems

A Comprehensive Design Flow for IC and Packaging for a 28GHz WiFi System

Fabian Hopsch, Fraunhofer IIS/EAS

A Fully Automated and Foundry-Independent Quality Assurance Platform for Cadence Process Design Kits

Anton Datsuk, IHP GmbH

Cadence Quantus Incremental Technology Flow for Extraction of Parasitics Between Packaging and IC
2022 Update: last updated 11/30/21

Lucas Brusamarello, NXP
Sylvie Parmantier, Cadence
Nikita Nikitenko, Yandex

Cadence RF IC Design Reference Flow at Samsung

Soonkeol Ryu, Samsung Electronics

Design of a Multiband Antenna System for an IoT Device Using IGNION ONE mXTEND Antenna Booster

Agusti Padros, Ramon Llull University
Sergi Balart, Ramon Llull University

GF Fotonix PEX EMIR Enhancements

Shanti Siemes, GLOBALFOUNDRIES
Ingo Kuehn, GLOBAL FOUNDRIES

Linearization of RF Frontends in EDA

Markus Loerner, Rohde & Schwarz International

Short-loop ASIC-Package Co-Design with Virtuoso Design Platform and Allegro Package Designer

Goeran Jerke, Robert Bosch GmbH
Sascha Hoefer, GlobalFoundaries
Chenbo Liu, GlobalFoundaries
Marcel Mueller, Robert Bosch GmbH
Vinko Marolt, Robert Bosch GmbH

Understanding On-Die Thermal Mismatch with Legato Reliability and Celsius

Stephan Endrass, Texas Instruments
Sudarshan Udayashankar, Texas Instruments
Mayank Jain, Texas Instruments

Virtuoso RF Co-Design Flow - S-parameter Extraction with Clarity 3D on the STM32WB

Romain Pilard, STMicroelectronics
Michel Ayraud, STMicroelectronics
Salvatore Cosentino, STMicroelectronics

X-FAB millimeter wave transmission lines components kit for 130nm RF SOI technology

Fadi Zaki, X-FAB

X-FAB RF Reference Kit Showing EM Simulations with EMX for 130nm SOI Technology

Smriti Joshi, X-FAB

Verification

Memory Verification in UVM made simpler using Algorithms and the role of vManager

Sougata Bhattacharjee, Samsung

A Highly Efficient Pre-Silicon Development Platform for PCIe Drivers of a SoC

Christian Bruel, STMicroelectronics
Salah Hama, STMicroelectronics
Vincent Motel, Cadence
Jeremie Chaboud, STMicroelectronics

Accelerating Debug and Signoff for RISC-V Processors Using Formal Verification

Ashish Darbari, Axiomise

Accelerating Safety and Security Features Verification of Specialized Processors with the Jasper Functional Safety App

Sedat Sayar, STMicroelectronics
Samuel Tomasi, STMicroelectronics
Jean Paul Henriques, STMicroelectronics

ATPG Scan Tests Runtime Improvement with Cadence MCE (Multi-core Engine)
120720 update 2021

Priyanka Murthy, NXP
Cezar De Oliveira Dos Santos, NXP

Creating a Simulation Hybrid for SoC Verification with Helium

Vincent Motel, Cadence
Isabelle Sename, STMicroelectronics
Houcine Oucheikh, STMicroelectronics
Bruno Moison, STMicroelectronics
Jerome Berliat, STMicroelectronics

Jasper CDC Analysis of Satellite Tracker RTL

Igor Mohor, u-blox

Portable Stimulus Test Development and Execution on ATE systems

Marcus Schulze Westenhorst, Advantest Europe
Markus Bücker, Advantest Europe

PSS Model as a Key Point to Prepare System Test from Early IP Verification

Claire Bonnet, STMicroelectronics
Claire Verilhac, STMicroelectronics
Solene NAVARO, STMicroelectronics

Real-Time Evaluation of 60 Powerline Communication Modems Using the Protium S1 FPGA Platform

Tobias Stuckenberg, University of Hannover
Holger Blume, University of Hannover

Setting-up a Jenkins Continuous Integration Flow on the Jasper Formal Verification Environment

Gregory Faux, STMicroelectronics
Laurent Martin-Borret, STMicroelectronics

Using Cadence Fault Campaign Manager for Fault Grading

Cezar de Oliveira dos Santos, NXP
Guillaume Peccatte, Infineon
Viktor Preis, Cadence
Kiran Kariyannavar, NXP Semiconductor