Modus DFT Software Solution Training
Date | Version | Country | Location | |
---|---|---|---|---|
Scheduled upon demandOn demand | EXPRESS INTERESTINQUIRE |
Length : 1 day
Course Description
In this course, you will learn how to use of the Modus™ Test Solution Automatic Test Pattern Generation product for static pattern generation.
Learning Objectives
After completing this course, you will be able to:
- Build a model (building the Modus Test Solution design database)
- Build the fault model
- Build test modes
- Verify test structures (design rule checking)
- Debug broken scan chains using the GUI and TCL command line techniques
- Create static tests (ATPG)
- Write vectors (Verilog, STIL, WGL)
Software Used in This Course
Modus Test Solution and Xcelium™ Parallel Simulator
Software Release(s)
MODUS172, XCELIUM1704
Modules in this Course
- Modus Test Basics and Flow
- How to Build a Model (Read the Netlist)
- How to Build the Fault Model
- How to Build Test Modes
- How to Verify Test Structures
- How to Debug Broken Scan Chains Using the Modus Test GUI
- How to Debug Broken Scan Scans Using the TCL Command Line Interface (CUI)
- How to Create Static Tests (ATPG)
- How to Write Vectors (Verilog, STIL, WGL)
Audience
- ASIC Designers
- Chip Designers
- Circuit Designers
- Custom Circuit Designers
- Design Engineers
- Design for Testability Engineers
- Digital IC Designers
- IC Designers
Prerequisites
You must have experience with or knowledge of:
- Test generation tools
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"Very good training. Very good tool.”
Andreas Schoch, Texas Instruments
“I successfully learned how to deploy Encounter Test for the various DFT-SCAN preparation checks and SCAN-chain insertion tasks. It was helpful to see during the training how to work with ET scripts in batch mode as well as how to deploy the GUI for resolving typical, basic DFT problems.(...)"
Christian Gehle, Texas Instruments
“Good course with an excellent presenter.”
Josy Bernard, Texas Instruments
“During the labs the trainer gave some additional hints which helped to work with the tool even better.”
Patrick Runkel, Texas Instruments