AI-Enhanced Variation Analysis for Analog/RF and Mixed-Signal Blocks, Memories, and Bit Cells, I/O Blocks, and Standard Cells

The Cadence Spectre StatAI Analysis enables fast, accurate, and comprehensive variation analysis of analog, RF, mixed signal, memories, standard cells, I/O cells, and bit cells for low-sigma or high-sigma requirements. Spectre StatAI Analysis leverages the Monte Carlo capabilities within Spectre Simulation Platform, available with the Spectre X and FX Simulators, Spectre RF Analysis, and Spectre AMS Designer. It is brute-force accurate with a fraction of the simulations.

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Spectre StatAI Analysis diagram

Quickly and Accurately Verify 3 to 6+ Sigma Yield Requirements to Avoid Expensive Respins

Accuracy

Provides right balance between accuracy and verification throughput using AI-enhanced and advanced statistics-based accurate estimation of worst-case samples and yield

Throughput

Orders of magnitude speedup versus brute-force Monte Carlo analysis by minimizing the number of samples needed for accurate high-sigma analysis

Scalability

Offers increased scalability through massively parallel distributed processing capability, scaling up to thousands of cores on a compute farm or on the cloud

Ease of Use

Intuitive use model with consolidated results for further analysis and debugging

  • Applicable to 3 to 6+ sigma applications: Includes memory arrays, bit cells, standard cells, analog, RF, and I/O blocks
  • Integrates with Cadence characterization and static timing flows
  • Determines circuit yield with a fixed simulation cost you define
  • Supports command line and Virtuoso ADE Suite use models
  • Scales to thousands of cores across compute farm and cloud infrastructure
  • Reusable statistical model to extend verification to higher sigma analysis
  • Detailed results include worst-case corners/samples, statistical moments, contribution report on circuit parameters, and QQ plots

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