Whiteboard Wednesdays - Scan Compression Fundamentals

In this week's Whiteboard Wednesdays video, Industry expert Rohit Kapur introduces the basic concepts of digital IC scan compression. Topics explained include the impacts of test application time and test data volume on test cost and the problems solved by implementing scan compression. To learn about the Cadence Modus DFT Software Solution, visit the product page at https://www.cadence.com/modus