With the continuous reduction of process size and the increase of design complexity, performance degradation and chip failure caused by IR drop and electromigration (EM) have become more common in chip design. To solve these problems, EMIR analysis needs to be carried out in the post-simulation sign-off stage of analog circuit design process. Unlike the post-simulation process in general analog circuit design, EMIR analysis usually requires special simulation and analysis tools. The tools involved in EMIR analysis are varied, mainly divided into three categories: design input, simulation, and result analysis. In traditional EMIR solutions, the design input stage is quite complex, and designers need to spend a long time sorting out design input files and various simulation analysis options that affect the results; the simulation process generally takes a long time because EMIR is a type of post-simulation and usually occurs at higher levels of design, balancing simulation speed and accuracy during post-simulation needs to be considered; in terms of result analysis, EMIR simulation usually generates a large amount of data, and how quickly the tool loads data and provides effective analysis methods is also very important. Voltus-XFi differs from traditional EMIR solutions in that it has made great improvements in all three aspects, providing a one-stop solution that allows designers to maintain a usage similar to that of general analog circuit simulation, thereby greatly reducing the time designers spend on the EMIR tool itself and helping designers efficiently focus on solving EMIR problems. This article mainly introduces the usage of Voltus-XFi.