Design for Test Fundamentals Training
Date | Version | Country | Location | |
---|---|---|---|---|
Scheduled upon demandOn demand | EXPRESS INTERESTINQUIRE |
Version | Region | |
---|---|---|
5.0 | Online | ENROLL |
4.0 | Online | ENROLL |
2.0 | Online | ENROLL |
Other Versions | Online | EXPRESS INTERESTINQUIRE |
Length: 1/2 Days (4 hours)
Course Description
This is a half-day introduction to the concepts and terminology of Automatic Test Pattern Generation (ATPG) and Digital IC Test.
Learning Objectives
After completing this course, you will be able to:
Understand and discuss why we test, what we test, and how we test, including:- List out the reasons for testing and its different aspects
- Describe how to perform testing
- Compare defects and faults
- Identify commonly used fault models
- Demonstrate generation of test patterns for combinational, sequential, and scanned circuits
- Identify basic DFT design rules
- Illustrate special tests for memory, cores, self-test, compression, I/Os, and so on
- List out test escapes and their effect on test volume and product quality
- Identify the basic diagnostic capabilities
Software Used in This Course
None
Software Release(s)
None
Modules in this Course
The Basics:- The Purpose of Testing
- The Target of Testing
- The Basics of Testing
Audience
- VHDL Designers
- Logic Designers
- Library Developers
- IC Designers
- Hardware Engineers
- Engineering Managers
- Electrical Engineers
- Digital IC Designers
- Designers
- Design for Testability Engineers
- Design Engineers
- Custom Circuit Designers
- Chip Designers
- Cadence Application Engineers
- ASIC Designers
- CAD System Administrators
- CAD Engineers
Prerequisites
There are no prerequisites for taking this class.
Related Courses
Please see course learning maps at this link for a visual representation of courses and course relationships. Regional course catalogs may be viewed here.
Course ID: 82125